A single event upset tolerant latch with parallel nodes
نویسندگان
چکیده
منابع مشابه
Implementation of a Distributed Fault-Tolerant NoC-based Architecture for the Single-Event Upset Detector
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In this article, two soft error tolerant SRAM cells, the so-called RATF1 and RATF2, are proposed and evaluated. The proposed radiation hardened SRAM cells are capable of fully tolerating single event upsets (SEUs). Moreover, they show a high degree of robustness against single event multiple upsets (SEMUs). Over the previous SRAM cells, RATF1 and RATF2 offer lower area and power overhead. The H...
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With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a growing concern in logic circuits. Accurate understanding and estimation of Single-EventUpset sensitivities of individual nodes is necessary to achieve better soft error hardening techniques at logic level design abstr...
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ژورنال
عنوان ژورنال: IEICE Electronics Express
سال: 2019
ISSN: 1349-2543
DOI: 10.1587/elex.16.20190208